Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Abstract

A simple and novel setup for high-frequency dielectric spectroscopy of materials has been developed using a portable vector network analyzer. The measurement principle is based on radio-frequency reflectometry, and both its capabilities and limitations are discussed. The results obtained on a typical liquid crystal prove that the device can provide reliable spectra between 107 Hz and 109 Hz, thus extending the capabilities of conventional impedance analyzers.