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Single-shot temporal characterization of XUV pulses with duration from ~10 fs to ~350 fs at FLASH

dc.contributor.authorIvanov, Rosen
dc.contributor.authorBermúdez Macias, Ivette J.
dc.contributor.authorLiu, Jia
dc.contributor.authorBrenner, Günter
dc.contributor.authorRoensch-Schulenburg, Juliane
dc.contributor.authorKurdi, Gabor
dc.contributor.authorFrühling, Ulrike
dc.contributor.authorWenig, Katharina
dc.contributor.authorWalther, Sophie
dc.contributor.authorDimitriou, Anastasios
dc.contributor.authorDrescher, Markus
dc.contributor.authorSazhina, Irina P.
dc.contributor.authorKazansky, Andrey K. ORCID
dc.contributor.authorKabachnik, Nikolay M.
dc.contributor.authorDüsterer, Stefan
dc.date.accessioned2020-11-03T11:04:16Z
dc.date.available2020-11-03T11:04:16Z
dc.date.issued2020-09-28
dc.identifier.citationJournal of Physics B-Atomic, Molecular and Optical Physics 53(18) : (2020) // Article ID 184004es_ES
dc.identifier.issn0953-4075
dc.identifier.issn1361-6455
dc.identifier.urihttp://hdl.handle.net/10810/47623
dc.description.abstractUltra-short extreme ultraviolet pulses from the free-electron laser FLASH are characterized using terahertz-field driven streaking. Measurements at different ultra-short extreme ultraviolet wavelengths and pulse durations as well as numerical simulations were performed to explore the application range and accuracy of the method. For the simulation of streaking, a standard classical approach is used which is compared to quantum mechanical theory, based on strong field approximation. Various factors limiting the temporal resolution of the presented terahertz streaking setup are investigated and discussed. Special attention is paid to the cases of very short (similar to 10 fs) and long (up to similar to 350 fs) pulses.es_ES
dc.description.sponsorshipWe want to acknowledge the work of the scientific and technical team at FLASH. NMK acknowledges the hospitality and financial support from DESY and from the theory group in cooperation with the SQS research group of the European XFEL (Hamburg). KW and MD acknowledge support by the SFB925-A1. UF and AD acknowledge support by the excellence cluster `The Hamburg Center for Ultrafast Imaging-Structure, Dynamics and Control of Matter at the Atomic Scale' (DFG)-EXC 1074 project ID 194651731. SW acknowledges support by the DFG Forschergruppe FOR 1789. Editoriales_ES
dc.language.isoenges_ES
dc.publisherIOPes_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/*
dc.subjecttemporal diagnostices_ES
dc.subjectXUV pulseses_ES
dc.subjectSASE FELes_ES
dc.subjectFLASHes_ES
dc.subjectTHz streakinges_ES
dc.subjectsingle cycle terahertz pulsees_ES
dc.subjectfree-electron laseres_ES
dc.subjectx-ray pulseses_ES
dc.subjectfieldes_ES
dc.subjectperformancees_ES
dc.subjectoperationes_ES
dc.subjectstreakinges_ES
dc.titleSingle-shot temporal characterization of XUV pulses with duration from ~10 fs to ~350 fs at FLASHes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holderOriginal content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.es_ES
dc.rights.holderAtribución 3.0 España*
dc.relation.publisherversionhttps://iopscience.iop.org/article/10.1088/1361-6455/ab9c38es_ES
dc.identifier.doi10.1088/1361-6455/ab9c38
dc.departamentoesFísica de materialeses_ES
dc.departamentoeuMaterialen fisikaes_ES


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