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Benchmarking of patents: An application of GAM methodology

dc.contributor.authorMariel Chladkova, Petr ORCID
dc.contributor.authorOrbe Mandaluniz, Susan
dc.date.accessioned2011-12-22T11:48:10Z
dc.date.available2011-12-22T11:48:10Z
dc.date.issued2007-04
dc.identifier.issn1134-8984
dc.identifier.urihttp://hdl.handle.net/10810/5627
dc.description.abstractThe present article reexamines some of the issues regarding the benchmarking of patents using the NBER data base on U.S. patents by generalizing a parametric citation model and by estimating it using GAM methodology. The main conclusion is that the estimated effects differ considerably from sector to sector, and the differences can be estimated nonparametrically but not by the parametric dummy variable approach.es
dc.description.sponsorshipFinancial aid from UPV-EHU (UPV038.321-G55/98) and Ministerio de Educación (SEJ2005-05549/ECON) is gratefully acknowledged.es
dc.language.isoenges
dc.relationinfo:eu-repo/grantAgreement/MCYT/SEJ2005-05549-ECON
dc.relation.ispartofseriesBiltoki 2007.02
dc.rightsinfo:eu-repo/semantics/openAccesses
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/*
dc.subjectUSPTOes
dc.subjectpatent benchmarkinges
dc.subjectGAMes
dc.titleBenchmarking of patents: An application of GAM methodologyes
dc.typeinfo:eu-repo/semantics/workingPaperes
dc.rights.holderAttribution-NonCommercial-ShareAlike 3.0 Unported*
dc.subject.jelO3
dc.subject.jelC14
dc.identifier.repecRePEc:ehu:biltok:200702es
dc.departamentoesEconomía aplicada III (Econometría y Estadística)es_ES
dc.departamentoeuEkonomia aplikatua III (ekonometria eta estatistika)es_ES
dc.subject.categoriaECONOMIC DEVELOPMENT, TECHNOLOGICAL CHANGE, AND GROWTH
dc.subject.categoriaMATHEMATICAL AND QUANTITATIVE METHODS


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Attribution-NonCommercial-ShareAlike 3.0 Unported
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-ShareAlike 3.0 Unported