Show simple item record

dc.contributor.authorPicón Ruiz, Artzai ORCID
dc.contributor.authorÁlvarez Gila, Aitor
dc.contributor.authorArteche Vicario, José Antonio
dc.contributor.authorLópez, Gabriel Alejandro ORCID
dc.contributor.authorVicente Rojo, Asier
dc.date.accessioned2021-09-02T10:07:02Z
dc.date.available2021-09-02T10:07:02Z
dc.date.issued2021-07-12
dc.identifier.citationIEEE Access 9 : 100513 - 100529 (2021)es_ES
dc.identifier.issn2169-3536
dc.identifier.urihttp://hdl.handle.net/10810/52895
dc.description.abstract[EN] Estimating the temperature of hot emissive samples (e.g. liquid slag) in the context of harsh industrial environments such as steelmaking plants is a crucial yet challenging task, which is typically addressed by means of methods that require physical contact. Current remote methods require information on the emissivity of the sample. However, the spectral emissivity is dependent on the sample composition and temperature itself, and it is hardly measurable unless under controlled laboratory procedures. In this work, we present a portable device and associated probabilistic model that can simultaneously produce quasi real-time estimates for temperature and spectral emissivity of hot samples in the [0.2, 12.0μm] range at distances of up to 20m. The model is robust against variable atmospheric conditions, and the device is presented together with a quick calibration procedure that allows for in field deployment in rough industrial environments, thus enabling in line measurements. We validate the temperature and emissivity estimates by our device against laboratory equipment under controlled conditions in the [550, 850◦C] temperature range for two solid samples with well characterized spectral emissivity’s: alumina (α −Al2O3) and hexagonal boron nitride (h −BN ). The analysis of the results yields Root Mean Squared Errors of 32.3◦C and 5.7◦C respectively, and well correlated spectral emissivity’s.es_ES
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineerses_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/*
dc.subjectprobabilistic computinges_ES
dc.subjectradiometryes_ES
dc.subjectspectral analysises_ES
dc.subjectspectral emissivityes_ES
dc.subjectspectroscopyes_ES
dc.subjectsteel industryes_ES
dc.subjecttemperature measurementes_ES
dc.titleA probabilistic model and capturing device for remote simultaneous estimation of spectral emissivity and temperature of hot emissive materialses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holderCCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.es_ES
dc.rights.holderAtribución 3.0 España*
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/9481229es_ES
dc.identifier.doi10.1109/ACCESS.2021.3096599
dc.departamentoesFísicaes_ES
dc.departamentoesIngeniería de sistemas y automáticaes_ES
dc.departamentoesIngeniería química y del medio ambientees_ES
dc.departamentoeuFisikaes_ES
dc.departamentoeuIngeniaritza kimikoa eta ingurumenaren ingeniaritzaes_ES
dc.departamentoeuSistemen ingeniaritza eta automatikaes_ES


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record

CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
Except where otherwise noted, this item's license is described as CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.