Development of a high-frequency dielectric spectrometer using a portable vector network analyzer
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2024-02-05Metadatos
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Review of Scientific Instruments 95(2) : (2024) // Article ID 023903
Resumen
A simple and novel setup for high-frequency dielectric spectroscopy of materials has
been developed using a portable vector network analyzer. The measurement principle
is based on radio-frequency reflectometry, and both its capabilities and limitations are
discussed. The results obtained on a typical liquid crystal prove that the device can
provide reliable spectra between 107 Hz and 109 Hz, thus extending the capabilities
of conventional impedance analyzers.